Very high frequency and microwave interferometric phase and amplitude noise measurements
نویسندگان
چکیده
The interferometric technique allows close-to-the-carrier measurements of both phase and amplitude noise, improving the instrument noise floor by 10–25 dB as compared to the traditional method based on a saturated mixer. Principles and basic equations describing the noise measurement system are given, together with design strategies suitable to microwave and very high frequency bands. Two prototypes, operating at 9 GHz and 100 MHz are discussed in detail. The relevant features of these prototypes are the capability to operate in a wide power range, below 0 dBm and above 20 dBm, and low noise floor. The latter is about 2180 dB rad/Hz ~white! and 150 dB rad/Hz ~flicker! at 1 Hz Fourier frequency, at carrier power from 9 to 15 dBm. © 1999 American Institute of Physics. @S0034-6748~99!02301-1#
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